1–20 von 33 Ergebnissen
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    How supercapacitors reach end of life criteria during calendar life and power cycling tests

    Chaari, R. / Briat, O. / Deletage, J.Y. et al. | Tema Archiv | 2011

    Electrical steering of vehicles - fault-tolerant analysis and design

    Blanke, M. / Thomsen, J.S. | Tema Archiv | 2006

    Reliability potential of epoxy based encapsulants for automotive applications

    Braun, T. / Becker, K.F. / Koch, M. et al. | Tema Archiv | 2005

    Technologies and reliability of modern embedded flash cells

    Sikora, A. / Pesl, F.P. / Unger, W. et al. | Tema Archiv | 2006

    Failure mechanisms and qualification testing of passive components

    Post, H.A. / Letullier, P. / Briolat, T. et al. | Tema Archiv | 2005

    Part average analysis - A tool for reducing failure rates in automotive electronics

    Wagner, M. / Unger, W. / Wondrak, W. | Tema Archiv | 2006

    Semiconductors in high temperature applications - a future trend in automotive industry

    Goroll, M. / Pufall, R. / Kanert, W. et al. | Tema Archiv | 2004

    Reliability aspects of semiconductor devices in high temperature applications

    Kanert, W. / Dettmer, H. / Plikat, B. et al. | Tema Archiv | 2003

    High temperature reliability testing of aluminum and tantalum electrolytic capacitors

    Dehbi, A. / Wondrak, W. / Ousten, Y. et al. | Tema Archiv | 2002

    Reliability of MEMS - a methodical approach

    Muller-Fiedler, R. / Wagner, U. / Bernhard, W. | Tema Archiv | 2002

    Reliability analysis of an automotive transmission system

    Kumar, P. / Gaindhar, J.L. | Tema Archiv | 1996

    Reliable power electronics for automotive applications

    Seliger, N. / Wolfgang, E. / Lefranc, G. et al. | Tema Archiv | 2002