1–20 von 32 Ergebnissen
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    BESS-Polar experiment: Progress and future prospects

    Yoshimura, K. / Abe, K. / Fuke, H. et al. | Elsevier | 2007

    Bone metabolism and formation of mice bred in a 2G environment

    Kita, S. / Iwasaki, K. / Onishi, R. et al. | Elsevier | 2003

    Composite grid structure with near-zero thermally induced deflection

    Yoon, K. / Park, Hoon / Lee, H. et al. | AIAA | 2000

    Continuous wave operation of MOCVD grown 1.55 /spl mu/m buried tunnel junction VCSELs

    Song, H.-W. / Kwon, O.-K. / Han, W.-S. et al. | IEEE | 2002

    Curving performance simulation of an EMS-type Maglev vehicle

    Yim, B. H. / Han, H. S. / Lee, J. K. et al. | Taylor & Francis Verlag | 2009

    Efficient Generation of Low-density Plasma Waveguides in Clustered Gases

    Kumarappan, V. / Sheng, H. / Layer, B.D. et al. | IEEE | 2005

    Enhanced Raman gain of novel bulk glasses

    Stegeman, R. / Jankovic, L. / Kim, H. et al. | IEEE | 2003

    Enhanced Terahertz Emission from InAs Quantum Dots on GaAs

    Park, H. / Kim, J. / Moon, K. et al. | IEEE | 2006

    Entrained sprays from meshed-interface occurring in a heat pipe

    Kihm, K. D. / Kim, B. H. / Peterson, G. P. | AIAA | 1994

    FITD Simulation of Terahertz Near-Field Microscopes

    Lee, K. / Yun, S. / Cho, M. et al. | IEEE | 2006

    Grazing Incidence Pumping (GRIP): Single- vs. Double- Pulse Arrangement

    Janulewicz, K. A. / Kim, C. M. / Kim, H. T. et al. | Springer Verlag | 2009

    Highly Efficient Surface Modification of Solids by Dual Action of XUV/Vis-NIR Laser Pulses

    Mocek, T. / Jakubczak, K. / Polan, J. et al. | Springer Verlag | 2009

    Investigation on the Spatial Properties of Silver X-Ray Laser Using GRIP Schemes

    Kim, H. T. / Janulewicz, K. A. / Kim, C. M. et al. | Springer Verlag | 2009

    Nanophotonics for information systems integration

    Fainman, Y. / Tetz, K. / Rokitski, R. et al. | IEEE | 2005

    Novel optical polymer devices for microwave applications

    Fetterman, H. / Kim, S.-K. / Geary, K. et al. | IEEE | 2003