1–20 von 25 Ergebnissen
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    AI applications to automatic testing: Trend for the future

    Porter, K.A. jun. | Tema Archiv | 1987
    Concepts from artificial intelligence (AI) that are applicable to diagnostic testing are presented. A prototype system for diagnosis that ...
    Schlagwörter: DIAGNOSTIC TESTING

    Dual port automatic testing: A proven approach (electronic warfare)

    Jolley, W.G. | Tema Archiv | 1987
    single computer to control both the testing of two LRUs simultaneously, in any combination, and the sharing of common station stimulus and ...
    Schlagwörter: ELECTRONIC EQUIPMENT TESTING , INTERMEDIATE-LEVEL TESTING

    Testing the MIL-STD 1553 serial bus on commercial functional automatic test equipment

    Reiss, A.J. | Tema Archiv | 1987
    . The goal in testing this application is to emulate the precise format of MIL-STD 1553. The author describes a functional automatic test ...
    Schlagwörter: ELECTRONIC EQUIPMENT TESTING , FUNCTIONAL AUTOMATIC TEST EQUIPMENT

    A low cost approach to factory testing using HITS

    Morris, C. / Mancini, J. | Tema Archiv | 1987
    Digital automatic test program generators (DATPGs) are ideal for factory test because of their adeptness in responding to changing test ...
    Schlagwörter: ELECTRONIC EQUIPMENT TESTING , DIGITAL AUTOMATIC TEST PROGRAM GENERATORS , FACTORY TESTING

    VHSIC interoperability standards and design for test rules: their impact on weapon system support concepts

    McDermott, J.T. | Tema Archiv | 1987
    Two developments in microelectronics have the potential to significantly change the way weapon systems are supported. They are the ...
    Schlagwörter: ELECTRONIC EQUIPMENT TESTING , IC TESTING , VHSIC INTEROPERABILITY STANDARDS , AUTOMATIC TEST SYSTEMS

    Waveform stimulus subsystem: an advanced technology multifunction subsystem on a card

    Pritchard, D.J. | Tema Archiv | 1987
    The F-15 TISS ATE (automatic test equipment) requires subsystem-on-a-card technology to achieve the required functionality within the space ...
    Schlagwörter: SUBSYSTEM-ON-A-CARD TECHNOLOGY

    A microprocessor based solution to TMDE management

    Brooks, R.G. | Tema Archiv | 1987
    The US Army's Communications Electronics Command (CECOM) at Fort Monmouth, NJ, has initiated several tasks to reduce the proliferation of ...
    Schlagwörter: ELECTRONIC EQUIPMENT TESTING

    Testability allocation and program monitoring for fault-tolerant systems prior to detailed design

    Allen, D. / Joe, E. / Fleming, R. et al. | Tema Archiv | 1987
    linear program links fault coverage to such measures as probability of mission success, hazard risk, life-cycle cost, and sortie availability ...
    Schlagwörter: ELECTRONIC EQUIPMENT TESTING

    SADT and TMTS-A marriage of complementary management concepts

    Weiner, M. / Chi, F.Y. | Tema Archiv | 1987
    The use of two tools to aid in the planning and management of complex-systems development is described. The tools are structured analysis ...
    Schlagwörter: STRUCTURED ANALYSIS AND DESIGN TECHNIQUE

    B-1B centralized test program set (TPS) integration facility (CTIF)-concept and status report

    Franke, D. / Poe, B.L. / Ledford, K.H. et al. | Tema Archiv | 1987
    the Emerson Electric Company (EEC) depot automatic test system for avionics (DATSA). This concept of TPS integration will bring under one ...
    Schlagwörter: US AIR FORCE MODULAR AUTOMATIC TEST EQUIPMENT

    WSTA-the IDSS weapon system testability analyzer

    Franco, J.R. jun. / Scott, J.M. | Tema Archiv | 1987
    Diagnostic Support System (IDSS) program. The WSTA is in the third phase (development and demonstration) of the program and is designed to provide ...

    Potential and documented cost-savings using IN-ATE

    Cantone, R. | Tema Archiv | 1987
    produce real cost savings. The Northrop Aircraft Division, in a detailed comparison study, independently developed two test programs to test the F ...
    Schlagwörter: ELECTRONIC EQUIPMENT TESTING

    Maintenance support equipment for multi-national collaborative programmes

    Milloy, G. | Tema Archiv | 1987
    associated with introducing technologically state-of-the-art weapon systems has meant that it becomes increasingly attractive to share the ...

    The Navy Integrated Diagnostic Support System-system overview, architecture and interfaces

    Rosenberg, B.J. | Tema Archiv | 1987
    Support System (IDSS), which provides a structured solution to diagnosis/maintenance deficiencies, is described. A concept definition of the tools ...

    An intelligent maintenance aid for portable ATE

    Hickey, K.A. / Kieu, T.C. / Adams, N.L. | Tema Archiv | 1987
    A description is given of the development approach taken to embed a diagnostic expert system within an existing avionics portable automated ...

    Automated calibration of PEACEKEEPER support equipment

    Ross, L. / Stribling, A. / Payne, T. et al. | Tema Archiv | 1987
    presented of: the automated calibration system developed to support PEACEKEEPER ATE at both the factory and the depot; unique design features that ...
    Schlagwörter: US AIR FORCE MODULAR-AUTOMATIC-TEST-EQUIPMENT

    APU MAID: A diagnostic expert system using heuristic and causal reasoning

    McCown, P.M. / Lewy, D.B. | Tema Archiv | 1987
    The APU (auxiliary power unit) maintenance aid (APU MAID) is an expert-system-based tool developed to enhance flightline maintenance. It ...
    Schlagwörter: POWER SUPPLIES TO APPARATUS

    Why use electronic manuals?

    Ventura, C.A. | Tema Archiv | 1987
    information accurate, complete, and up-to-date. The technique can also make information less complex/disorienting by applying database management ...
    Schlagwörter: DATABASE MANAGEMENT TECHNOLOGY

    Planning and organizing a military ATE proposal

    Witts, D.P. | Tema Archiv | 1987
    The author addresses several basic aspects of the military automatic test equipment proposal, including planning and organizing a staff to ...

    The technical advantages of IFTE over its predecessors

    Ucci, R.M. / Romania, J.J. jun. | Tema Archiv | 1987
    ATE advances incorporated into IFTE to enhance testing capabilities and test program set (TPS) development. They discuss the technological ...
    Schlagwörter: OPTICAL DISK TECHNOLOGY