Synonyme wurden verwendet für: atomic force microscopy
Suche ohne Synonyme: keywords:("atomic force microscopy")

1–50 von 90 Ergebnissen
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    2D and 3D Positioning Performance of UAV-Based Photogrammetry in Residential Regions

    Freier Zugriff
    Mehmet Nurullah Alkan / Kayhan Aladogan / Zafer Kose et al. | DOAJ | 2020
    Schlagwörter: sfm

    Accuracy Assessment of a UAV Direct Georeferencing Method and Impact of the Configuration of Ground Control Points

    Freier Zugriff
    Xiaoyu Liu / Xugang Lian / Wenfu Yang et al. | DOAJ | 2022
    Schlagwörter: structure from motion (SfM)

    Accuracy Assessment of Direct Georeferencing for Photogrammetric Applications Based on UAS-GNSS for High Andean Urban Environments

    Freier Zugriff
    Rolando Salas López / Renzo E. Terrones Murga / Jhonsy O. Silva-López et al. | DOAJ | 2022
    Schlagwörter: SfM

    Advanced Characterization of Multifunctional Nanocomposites

    Pestian, Nellie / Nepal, Dhriti | Springer Verlag | 2020
    Schlagwörter: AFM , AFM-IR

    Advanced Fiber-Optic Monitoring System for Space-Flight Applications

    M. S. Hull / R. L. Van Tassell / C. D. Pennington et al. | NTIS | 2005
    Schlagwörter: Atomic force microscopy

    AFM Analysis of 3D Printing PEI for Automotive Applications

    Nguyen, Khanh Q. / Vuillaume, Pascal Y. / Robert, Mathieu et al. | Springer Verlag | 2023
    Schlagwörter: Atomic force microscope (AFM) analysis

    After 34,000 orbits of earth, polymers analyzed by SPM

    Kalil, C.R. | Tema Archiv | 1995
    Schlagwörter: Rasterkraftmikroskop

    A Ground Point Fitting Method for Winter Wheat Height Estimation Using UAV-Based SfM Point Cloud Data

    Freier Zugriff
    Xiaozhe Zhou / Minfeng Xing / Binbin He et al. | DOAJ | 2023
    Schlagwörter: UAV SfM point cloud

    Aluminum oxynitride coatings for oxidation resistance of epoxy films

    Ianno, N.J. / Enshashy, H. / Dillon, R.O. | Tema Archiv | 2002
    Schlagwörter: Atomkraftmikroskopie

    A new mechanical-electrical approach to the wheel-rail contact

    Descartes, S. / Renouf, M. / Fillot, N. et al. | Tema Archiv | 2008
    Schlagwörter: Rasterkraftmikroskopie

    A New Method for High Resolution Surface Change Detection: Data Collection and Validation of Measurements from UAS at the Nevada National Security Site, Nevada, USA

    Freier Zugriff
    Brandon Crawford / Erika Swanson / Emily Schultz-Fellenz et al. | DOAJ | 2021
    Schlagwörter: structure from motion (SFM)

    Anti-fouling silicone elastomers for offshore structures

    Weinell, Claus E. / Marsh, Nicholas / Roll, Jan | Tema Archiv | 2006
    Schlagwörter: Rasterkraftmikroskopie

    A study of atomic oxygen interactions with protected silver surfaces

    Gouzman, I. / Grossman, E. / Murat, M. et al. | Tema Archiv | 2003
    Schlagwörter: Atomkraftmikroskopie

    Atomic oxygen resistant inorganic materials for LEO applications

    Poire, E. / Lachance, J. | Tema Archiv | 1999
    Schlagwörter: Atomkraftmikroskopie

    Calibration of inertial and vision systems as a prelude to multi-sensor fusion

    Randeniya, D.I.B. / Gunaratne, M. / Sarkar, S. et al. | Elsevier | 2007
    Schlagwörter: INS/SFM fusion

    Carbon Nanotube Modified Asphalt Binders for Sustainable Roadways

    Tarefder, Rafiqul A. / Zaman, Arif | Springer Verlag | 2016
    Schlagwörter: Atomic force microscopy

    Change Detection Applications in the Earth Sciences Using UAS-Based Sensing: A Review and Future Opportunities

    Freier Zugriff
    Christian G. Andresen / Emily S. Schultz-Fellenz | DOAJ | 2023
    Schlagwörter: SfM

    Comparing UAS LiDAR and Structure-from-Motion Photogrammetry for Peatland Mapping and Virtual Reality (VR) Visualization

    Freier Zugriff
    Margaret Kalacska / J. Pablo Arroyo-Mora / Oliver Lucanus | DOAJ | 2021
    Schlagwörter: SfM

    Cost-effective Framework for Rapid Underwater Mapping with Digital Camera and Color Correction Method

    Chang, Anjin / Jung, Jinha / Um, Dugan et al. | Springer Verlag | 2019
    Schlagwörter: Structure from Motion (SfM)

      Cost-effective Framework for Rapid Underwater Mapping with Digital Camera and Color Correction Method

      Chang, Anjin / Jung, Jinha / Um, Dugan et al. | Online Contents | 2019
      Schlagwörter: Structure from Motion (SfM)

    Decrease of contractile properties and transversal stiffness of single fibers in human soleus after 7-day “dry” immersion

    Ogneva, I.V. / Ponomareva, E.V. / Kartashkina, N.L. et al. | Elsevier | 2010
    Schlagwörter: Atomic force microscopy

    Demonstrator for nano-precision multi-agent MagLev positioning platform for high throughput metrology

    Freier Zugriff
    Kramer, Lukas / van den Dool, Teun / Witvoet, Gert | BASE | 2019
    Schlagwörter: Atomic Force Microscopy

    Deriving First Floor Elevations within Residential Communities Located in Galveston Using UAS Based Data

    Freier Zugriff
    Nicholas D. Diaz / Wesley E. Highfield / Samuel D. Brody et al. | DOAJ | 2022
    Schlagwörter: Structure-from-Motion (SfM)

    Destination and route choice models for bidirectional pedestrian flow based on the social force model

    Freier Zugriff
    Ning‐bo, Cao / Zhao‐wei, Qu / Yong‐heng, Chen et al. | Wiley | 2017
    Schlagwörter: SFM

      Destination and route choice models for bidirectional pedestrian flow based on the social force model

      Freier Zugriff
      Ning-bo, Cao / Zhao-wei, Qu / Yong-heng, Chen et al. | IET | 2017
      Schlagwörter: SFM

    Diagnostic characterization of high power lithium-ion batteries for use in hybrid electric vehicles

    Zhang, X. / Ross, P.N. / Kostecki, R. et al. | Tema Archiv | 2001
    Schlagwörter: Atomkraftmikroskopie

    Effect of 10 MeV electron irradiation on polyimide composites for space systems

    Cherkashina, N.I. / Pavlenko, V.I. / Abrosimov, V.M. et al. | Elsevier | 2021
    Schlagwörter: AFM , atomic force microscopy

    Effect of low earth orbit atomic oxygen exposure on phenylphosphine oxide-containing polymers

    Connell, J.W. | Tema Archiv | 1999
    Schlagwörter: Atomkraftmikroskopie

    Effect of plasma immersion ion implantation and deposition on high temperature oxidation of titanium alloy IMI 834-aluminizing

    Gurrappa, I. / Manova, D. / Gerlach, J.W. et al. | Tema Archiv | 2006
    Schlagwörter: Rasterkraftmikroskop

    Effects of Flight and Smoothing Parameters on the Detection of Taxus and Olive Trees with UAV-Borne Imagery

    Freier Zugriff
    Sam Ottoy / Nikolaos Tziolas / Koenraad Van Meerbeek et al. | DOAJ | 2022
    Schlagwörter: SfM

    Evaluating the Efficacy and Optimal Deployment of Thermal Infrared and True-Colour Imaging When Using Drones for Monitoring Kangaroos

    Freier Zugriff
    Elizabeth A. Brunton / Javier X. Leon / Scott E. Burnett | DOAJ | 2020
    Schlagwörter: SfM

    Expeditious Low-Cost SfM Photogrammetry and a TLS Survey for the Structural Analysis of Illasi Castle (Italy)

    Freier Zugriff
    Massimo Fabris / Pietro Fontana Granotto / Michele Monego | DOAJ | 2023
    Schlagwörter: SfM photogrammetry

    Experimental Investigation on Tensile and Fracture Behaviour of Glass Fibre-Reinforced Nanoclay/Mg–Al LDH-Based Fibre Metal Laminates

    Logesh, K. / Bupesh Raja, V. K. / Venkatasudhahar, M. et al. | Springer Verlag | 2018
    Schlagwörter: Atomic force microscope (AFM)

    Experimental Study on the Ice Freezing Adhesive Characteristics of Metal Surfaces

    Dong, W. / Ding, J. / Zhou, Z. X. | AIAA | 2014
    Schlagwörter: Scanning Force Microscopy

    Feedback Control in an Atomic Force Microscope Used as a Nano-Manipulator

    Freier Zugriff
    Hrouzek, M. | BASE | 2005
    Schlagwörter: atomic force microscopy

    Giant and Tunable Mechanical Impulse of Energetic Nanocrystalline Porous Silicon

    Nguyen, Viet Cuong / Pita, K. / Kam, C. H. et al. | AIAA | 2015
    Schlagwörter: Atomic Force Microscopy

    Grain refinement in electrogalvanized coatings

    Martyak, Nicholas M. | Tema Archiv | 2003
    Schlagwörter: Atomkraftmikroskopie

    Green strength enhancement in BIIR/Olefin copolymer compounds

    Tsou, Andy H. / Duvdevani, Ilan / Datta, Sudhin | Tema Archiv | 2006
    Schlagwörter: Rasterkraftmikroskopie

    High-Tech aus Europa für den Mars

    Lemme, Helmut | Tema Archiv | 2008
    Schlagwörter: Rasterkraftmikroskop

    Identification and Validation of an Engine Performance Database Model for the Flight Management System

    Ghazi, Georges / Botez, Ruxandra Mihaela | AIAA | 2019
    Schlagwörter: AFM

    Integrating Post-Processing Kinematic (PPK)–Structure-from-Motion (SfM) with Unmanned Aerial Vehicle (UAV) Photogrammetry and Digital Field Mapping for Structural Geological Analysis

    Freier Zugriff
    CIRILLO Daniele / Cerritelli Francesca / Agostini Silvano et al. | BASE | 2022
    Schlagwörter: structure-from-motion (SfM)

    Intelligent fast 3D - surface quality control and applications in the automotive industry

    Leopold, J. / Günther, H. / Fürderer, K. et al. | Tema Archiv | 2000
    Schlagwörter: Atomkraftmikroskopie

    Investigation and tuning of organic thin films by methods of atomic force microscopy

    Limböck, Thorsten Simon | TIBKAT | 2019
    Schlagwörter: Rasterkraftmikroskopie

    Investigation of surface morphology, optical and electronic properties of Mg2Si thin films on Si(111)

    Freier Zugriff
    D. V. Fomin / A. V. Polyakov / K. N. Galkin et al. | DOAJ | 2024
    Schlagwörter: atomic force microscopy

    Ionizing radiation-induced fragmentation of plasmid DNA – Atomic force microscopy and biophysical modeling

    Psonka, K. / Gudowska-Nowak, E. / Brons, S. et al. | Elsevier | 2007
    Schlagwörter: Atomic force microscopy

    Mapping photovoltaic performance with nanoscale resolution

    Kutes, Yasemin | Online Contents | 2016
    Schlagwörter: atomic force microscopy (AFM)