Synonyme wurden verwendet für: metrology
Suche ohne Synonyme: keywords:(optical metrology)

1–20 von 114 Ergebnissen
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    X-ray study of the roughness of surfaces and interfaces [4099-12]

    Kozhevnikov, I. V. / Asadchikov, V. E. / Bukreeva, I. N. et al. | British Library Conference Proceedings | 2000
    Schlagwörter: optical metrology

    X-ray study of surfaces and interfaces [4449-31]

    Asadchikov, V. E. / Bukreeva, I. N. / Duparre, A. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: optical metrology

    X-ray investigations of a near surface layer of metal samples [4099-33]

    Gilev, O. N. / Asadchikov, V. E. / Duparre, A. et al. | British Library Conference Proceedings | 2000
    Schlagwörter: optical metrology

    Wavelet- and entropy-based feature extraction: application to distinguishing mixtures of beverages [4877-22]

    Kokuer, M. / Murtagh, F. D. / Augousti, A. T. et al. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Versatile optical system for static and dynamic thermomagnetic recording using a scanning laser microscope [4449-26]

    Clegg, W. W. / Jenkins, D. F. / Helian, N. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: optical metrology

    Variable angle spectroscopic ellipsometry in the vacuum ultraviolet (Invited Paper) [4099-24]

    Woollam, J. A. / Hilfiker, J. N. / Tiwald, T. E. et al. | British Library Conference Proceedings | 2000
    Schlagwörter: optical metrology

    Using quantitative statistics for the construction of machine vision systems (Keynote Address) [4877-12]

    Thacker, N. A. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Use of light scatter signals to identify particle material (Invited Paper) [4449-17]

    Stover, J. C. / Ivakhnenko, V. I. / Eremin, Y. A. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: optical metrology

    Two- and three-dimensional vision systems for inspection, control, and metrology II : 26 - 27 October 2004, Philadelphia, Pennsylvania, USA

    Denshi Jōhō Tsūshin Gakkai, Tsūshin Sosaieti | TIBKAT | 2004
    Schlagwörter: Metrology , Optical measurements , Optical methods

    Two- and three-dimensional vision systems for inspection, control, and metrology : 29 - 30 October 2003, Providence, Rhode Island, USA

    Batchelor, Bruce G. | TIBKAT | 2004
    Schlagwörter: Optical pattern recognition systems , Metrology , Optical measurements

    Tracking of facial features using deformable triangles [4877-18]

    Pradeep, P. P. / Whelan, P. F. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Toolbox of Metrology-Based Techniques for Optical System Alignment

    P. Coulter / R. G. Ohl / D. A. Kubalak et al. | NTIS | 2016
    Schlagwörter: Optical measuring instruments , Metrology

      Toolbox of Metrology-Based Techniques for Optical System Alignment

      P. Coulter / R. G. Ohl / S. L. Hicks et al. | NTIS | 2016
      Schlagwörter: Metrology , Optical measuring instruments , Optical equipment

    Three-dimensional laser ranging image reconstruction using three-line laser sensors and fuzzy methods [3835-12]

    Bursanescu, L. / Hamdi, M. / SPIE | British Library Conference Proceedings | 1999
    Schlagwörter: optical metrology

    Three-dimensional imaging, compression, and reconstruction of digital holograms [4877-13]

    Naughton, T. J. / Frauel, Y. / Matoba, O. et al. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Testing the James Webb Space Telescope (JWST) Primary Mirror

    H. P. Stahl | NTIS | 2014
    Schlagwörter: Optical equipment , Metrology

    Surface Profile Correction of Replicated X-Ray Optics Through Differential Deposition

    K. Kilaru / C. Atkins / B. D. Ramsey et al. | NTIS | 2011
    Schlagwörter: Optical Detection , Metrology

    Stitching interferometry of aspherical surfaces [4449-34]

    Hansel, T. / Nickel, A. / Schindler, A. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: optical metrology

    Statis omnidirectional stereoscopic display system [3835-10]

    Barton, G. G. / Feldman, S. / Beckstead, J. A. et al. | British Library Conference Proceedings | 1999
    Schlagwörter: optical metrology

    Standardization of the measurement of laser-induced damage threshold and material absorption [4449-12]

    Wood, R. M. / SPIE | British Library Conference Proceedings | 2001
    Schlagwörter: optical metrology

    Standardization in optics characterization (Invited Paper) [4099-14]

    Ristau, D. / SPIE | British Library Conference Proceedings | 2000
    Schlagwörter: optical metrology