Synonyme wurden verwendet für:
metrology
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keywords:(optical metrology)
X-ray study of the roughness of surfaces and interfaces [4099-12]
X-ray study of surfaces and interfaces [4449-31]
X-ray investigations of a near surface layer of metal samples [4099-33]
Variable angle spectroscopic ellipsometry in the vacuum ultraviolet (Invited Paper) [4099-24]
Use of light scatter signals to identify particle material (Invited Paper) [4449-17]
Tracking of facial features using deformable triangles [4877-18]
Toolbox of Metrology-Based Techniques for Optical System Alignment
Toolbox of Metrology-Based Techniques for Optical System Alignment
Three-dimensional imaging, compression, and reconstruction of digital holograms [4877-13]
Testing the James Webb Space Telescope (JWST) Primary Mirror
Surface Profile Correction of Replicated X-Ray Optics Through Differential Deposition
Stitching interferometry of aspherical surfaces [4449-34]
Statis omnidirectional stereoscopic display system [3835-10]
Standardization in optics characterization (Invited Paper) [4099-14]