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    Titel :

    Versatile optical system for static and dynamic thermomagnetic recording using a scanning laser microscope [4449-26]


    Beteiligte:

    Kongress:

    Conference; 2nd, Optical metrology roadmap for the semiconductor, optical, and data storage industries ; 2001 ; San Diego, CA



    Erscheinungsdatum :

    2001-01-01


    Format / Umfang :

    7 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Nr. 4449

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    X-ray study of surfaces and interfaces [4449-31]

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    Microstructure of thin films: correlation with laser damage threshold [4449-35]

    Ciosek, J. / Paszkowicz, W. / Pankowski, P. et al. | British Library Conference Proceedings | 2001