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Halbleiterbauelement
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keywords:("Halbleiterbauelement")
Accuracy of optical thin film parameter determination based on spectrophotometric data [5188-24]
VUV light-scattering measurements of substrates and thin film coatings [5188-14]
Modeling of Carrier Transport in Multiquantum Well Infrared Detectors
Double-diode configuration of self-calibrating photodiodes [5188-42]
Phase-shifting algorithm via wavelength tuning based on temporal Fourier transform [5188-41]
Absolute high-accuracy deflectometric measurement of topography [5188-39]
Photothermal microscopy and laser damage in optical components (Invited Paper) [5188-22]