Synonyme wurden verwendet für: Halbleiterbauelement
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141–150 von 150 Ergebnissen
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    Accuracy of optical thin film parameter determination based on spectrophotometric data [5188-24]

    Tikhonravov, A. V. / Trubetskov, M. K. / DeBell, G. W. et al. | British Library Conference Proceedings | 2003
    Schlagwörter: semiconductors

    VUV light-scattering measurements of substrates and thin film coatings [5188-14]

    Hultaker, A. / Gliech, S. / Benkert, N. et al. | British Library Conference Proceedings | 2003
    Schlagwörter: semiconductors

    Modeling of Carrier Transport in Multiquantum Well Infrared Detectors

    Brandel, A. / Fraenkel, A. / Betser, Y. et al. | British Library Conference Proceedings | 1995
    Schlagwörter: compound semiconductors

    The Effects of V/III Ratio on Optical, Electrical, and Structural Properties of InAs~0~.~3Sb~0~.~7 Grown by LP-MOCVD

    Choi, Y. H. / Labeyrie, G. / Staveteig, P. T. et al. | British Library Conference Proceedings | 1995
    Schlagwörter: compound semiconductors

    Double-diode configuration of self-calibrating photodiodes [5188-42]

    Guryev, M. / Kupko, A. / Nazarenko, L. et al. | British Library Conference Proceedings | 2003
    Schlagwörter: semiconductors

    Phase-shifting algorithm via wavelength tuning based on temporal Fourier transform [5188-41]

    Yu, Y. / Zhang, B. / Jiao, Y. et al. | British Library Conference Proceedings | 2003
    Schlagwörter: semiconductors

    Absolute high-accuracy deflectometric measurement of topography [5188-39]

    Illemann, J. / International Society for Optical Engineering | British Library Conference Proceedings | 2003
    Schlagwörter: semiconductors

    Advanced industrial fluorescence metrology used for qualification of high-quality optical materials [5188-23]

    Engel, A. / Becker, H.-J. / Sohr, O. et al. | British Library Conference Proceedings | 2003
    Schlagwörter: semiconductors

    Photothermal microscopy and laser damage in optical components (Invited Paper) [5188-22]

    Commandre, M. J. / Natoli, J. Y. / Amra, C. et al. | British Library Conference Proceedings | 2003
    Schlagwörter: semiconductors

    Three-dimensional reconstruction of refractive index distribution in optical phase elements by interferometric and photoelastic tomography (Invited Paper) [5188-06]

    Kujawinska, M. / Kniazewski, P. / International Society for Optical Engineering | British Library Conference Proceedings | 2003
    Schlagwörter: semiconductors