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    Titel :

    Three-dimensional reconstruction of refractive index distribution in optical phase elements by interferometric and photoelastic tomography (Invited Paper) [5188-06]



    Kongress:

    Annual conference, Advanced characterization techniques for optics, semiconductors, and nanotechnologies



    Erscheinungsdatum :

    2003-01-01


    Format / Umfang :

    13 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Photothermal microscopy and laser damage in optical components (Invited Paper) [5188-22]

    Commandre, M. J. / Natoli, J. Y. / Amra, C. et al. | British Library Conference Proceedings | 2003


    Optimization of optical coatings for the UV/VUV range (Invited Paper) [5188-11]

    Ristau, D. / Gunster, S. / International Society for Optical Engineering | British Library Conference Proceedings | 2003


    Advanced transmission electron microscopy for nano-optics (Invited Paper) [5188-28]

    Kaiser, U. A. / International Society for Optical Engineering | British Library Conference Proceedings | 2003


    Reliable determination of wavelength dependence of thin film refractive index [5188-25]

    Tikhonravov, A. V. / Trubetskov, M. K. / Amotchkina, T. V. et al. | British Library Conference Proceedings | 2003


    Characterization of polarization aberrations in liquid crystal devices (Invited Paper) [5188-01]

    Wolfe, J. / Chipman, R. / International Society for Optical Engineering | British Library Conference Proceedings | 2003