61–65 von 65 Ergebnissen
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    Rotating compensator spectroscopic ellipsometry (RCSE) and its application to high-k dielectric film HfO~2 [4099-27]

    Leng, J. / Li, S. / Opsal, J. L. et al. | British Library Conference Proceedings | 2000
    Schlagwörter: semiconductor industries , data storage industries

    In-situ ellipsometric measurements of thin film aluminum oxidation [4099-26]

    Lindmark, E. K. / Nowak, J. J. / Kief, M. T. et al. | British Library Conference Proceedings | 2000
    Schlagwörter: semiconductor industries , data storage industries

    Optical characterization of doping profiles in silicon [4099-04]

    Bernini, R. / Zeni, L. / Pierri, R. et al. | British Library Conference Proceedings | 2000
    Schlagwörter: semiconductor industries , data storage industries

    1992 4TH NASA SERC Symposium on VLSI Design

    S. R. Whitaker | NTIS | 1992
    Schlagwörter: Semiconductor Devices , Industries

    VHSIC Electronics and the Cost of Air Force Avionics in the 1990s

    P. S. Killingsworth / J. M. Jarvaise | NTIS | 1990
    Schlagwörter: Semiconductor Devices , Industries