XM-1: the high-resolution soft x-ray microscope at the Advanced Light Source [4146-25]
Wireless Integrated Network Sensors (WINS): Space Science and Technology
Trends in optical design of projection lenses for UV and EUV lithography [4146-02]
Software tools to simulate the 16⅔ Hz traction power network of OBB
Si-based multilayers with high thermal stability [4146-23]
Present status of the ASET at-wavelength phase-shifting point diffraction interferometer [4146-05]
Portable diagnostics for EUV light sources [4146-13]
Optimization of air gap for two-dimensional imaging system using synchrotron radiation [4146-21]
Optical layout of BACH: a beamline for advanced dichroism at Elettra [4146-15]