An investigation of hydrogen degradation of GaAs MMICs (MESFET, PHEMT, HBT) was conducted to determine the threshold hydrogen concentration for spacecraft applications. The maximum hydrogen in the hermetic package is found to be 0.6 torr (based on 10 year mission at ambient temperature of 125 deg C). Hydrogen evolution in hermetic package is also studied to determine the source of hydrogen and minimize its level in the package. Both studies demonstrate the high reliability of hermetic A40 (Al/Si) and Kovar (Fe/Ni/Co) packages for spacecraft applications.


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    Titel :

    Hydrogen degradation of GaAs MMICs and hydrogen evolution in the hermetic package


    Weitere Titelangaben:

    Wasserstoffbedingte Leistungsminderung von integrierten Mikrowellenschaltungen aus Galliumarsenid und Entstehung von Wasserstoff in hermetisch abgeschlossenen Gehäusen


    Beteiligte:
    Saito, Y. (Autor:in) / Griese, R. (Autor:in) / Kessler, J. (Autor:in) / Kono, R. (Autor:in) / Fang, J. (Autor:in)


    Erscheinungsdatum :

    1995


    Format / Umfang :

    4 Seiten, 8 Bilder, 7 Quellen




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




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