Field Programmable Gate Arrays (FPGAs) are being used in space applications because of attractive attributes: good density, moderate speed, low cost, and quick turn-around time. However, these devices are susceptible to Single Event Upsets (SEUs). An approach using triple modular redundancy (TMR) and feedback was developed for flip-flop hardening in these devices. Test data showed excellent results for this circuit topology. Total dose and Single Event Effect (SEE) testing have been performed on recently released technologies. Failures are analyzed and test methodology is discussed.


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    Titel :

    SEU hardening of field programmable gate arrays (FPGAS) for space applications and device characterization


    Weitere Titelangaben:

    Sogenannte SEU (single event upset)-Festigkeit auf feldprogrammierbaren Gate-Arrays für Anwendungen in der Raumfahrt und Gerätecharakterisierung


    Beteiligte:
    Katz, R. (Autor:in) / Barto, R. (Autor:in) / McKerracher, P. (Autor:in) / Koga, P. (Autor:in)


    Erscheinungsdatum :

    1994


    Format / Umfang :

    8 Seiten, 4 Bilder, 5 Tabellen, 6 Quellen




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




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