The purpose is to create a new qualification methodology for plastic encapsulated electronic components used in an automotive environment at high temperature. It is based on the acceleration of failure mechanisms like ball bond lift (due to intermetallic Au-Al thickness growth), by combination of environmental stresses. The delamination measurement was used as an indicator of potential assembly weaknesses. An optimized package sequential qualification test flow is proposed.


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    Titel :

    Sequential environmental stresses tests qualification for automotive components


    Weitere Titelangaben:

    Sequentielle Umwelteinflußprüfung für Autoelektronikkomponenten


    Beteiligte:
    Bahi, M.A. (Autor:in) / Lecuyer, P. (Autor:in) / Fremont, H. (Autor:in) / Landesman, J.P. (Autor:in)

    Erschienen in:

    Microelectronics Reliability ; 47 , 9-11 ; 1680-1684


    Erscheinungsdatum :

    2007


    Format / Umfang :

    5 Seiten, 4 Bilder, 1 Tabelle, 8 Quellen




    Medientyp :

    Aufsatz (Zeitschrift)


    Format :

    Print


    Sprache :

    Englisch






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