The purpose is to create a new qualification methodology for plastic encapsulated electronic components used in an automotive environment at high temperature. It is based on the acceleration of failure mechanisms like ball bond lift (due to intermetallic Au-Al thickness growth), by combination of environmental stresses. The delamination measurement was used as an indicator of potential assembly weaknesses. An optimized package sequential qualification test flow is proposed.
Sequential environmental stresses tests qualification for automotive components
Sequentielle Umwelteinflußprüfung für Autoelektronikkomponenten
Microelectronics Reliability ; 47 , 9-11 ; 1680-1684
2007
5 Seiten, 4 Bilder, 1 Tabelle, 8 Quellen
Aufsatz (Zeitschrift)
Englisch
Knowledge-based qualification tests for electronic components in harsh environments
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