In this paper, we describe a knowledge-based system that diagnoses component faults in analog circuit cards by reasoning about the function of those components. The approach can be sharply contrasted by the typical approach in circuit diagnosis which employs structural reasoning (i.e., exhaustive test of each component without regards to function). Functional reasoning takes into account the designed behavior and associated function of different subcircuit modules. Examples are presented using two analog power supplies. A knowledge-based programming language is presented that allows one to express their understanding of subcircuit module functionality (e.g., what a rectifier does) and the function of components in various modules (e.g., what a capacitor in a filter does). A computer program is demonstrated that uses these functional descriptions. Advantages over structural reasoning approaches are discussed.


    Zugriff

    Zugriff über TIB

    Verfügbarkeit in meiner Bibliothek prüfen


    Exportieren, teilen und zitieren



    Titel :

    Functional reasoning in analog circuits


    Weitere Titelangaben:

    Funktionelle Beweisfuehrung in analogen Schaltungen


    Beteiligte:
    Wunz, D.R. jun. (Autor:in) / Cross, S.E. (Autor:in)


    Erscheinungsdatum :

    1986


    Format / Umfang :

    8 Seiten, 2 Bilder, 16 Quellen


    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Diagnostic Coverage Evaluation Method for Analog Circuits to Comply with Functional Safety Standards

    Inada, Ryoichi / Hata, Takahiro / Hirotsu, Teppei et al. | SAE Technical Papers | 2015


    Evolution of analog circuits on a programmable analog multiplexer array

    Santini, C.C. / Zebulumi, R. / Pacheco, M.A.C. et al. | IEEE | 2001



    Simulation of analog Costas loop circuits

    Best, R. E. / Kuznetsov, N. V. / Leonov, G. A. et al. | British Library Online Contents | 2014


    Susceptibility Detection of Analog and Digital Circuits

    Marziali, I. / Boschetti, D. / Nicoletto, M. et al. | IEEE | 2019