Based on reachable set estimation, a fault symptoms generation method is proposed for linear discrete-time systems with unknown but bounded uncertainties. The operating status of healthy systems are divided into two categories by considering the actuator faults and sensor faults respectively. Based on Zonotopic technique, a method for generating the system output boundary with credible bounded fault sets is designed by using reachable set estimation to obtain the symptoms of the faulty systems, which provides a new strategy for fault diagnosis and location. Finally, the effectiveness of the proposed method is demonstrated by a F-18 aircraft motion example.


    Zugriff

    Zugriff prüfen

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    Fault Symptoms Generation via Reachable Set Estimation


    Weitere Titelangaben:

    Lect. Notes Electrical Eng.


    Beteiligte:
    Yan, Liang (Herausgeber:in) / Duan, Haibin (Herausgeber:in) / Yu, Xiang (Herausgeber:in) / He, Yikang (Autor:in) / Wang, Zhenrong (Autor:in) / Wang, Zhenhua (Autor:in) / Shen, Yi (Autor:in)


    Erscheinungsdatum :

    30.10.2021


    Format / Umfang :

    11 pages





    Medientyp :

    Aufsatz/Kapitel (Buch)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch




    REACHABLE RANGE CALCULATION DEVICE, REACHABLE RANGE CALCULATION METHOD, AND REACHABLE RANGE CALCULATION PROGRAM

    HIROSE TOMOHIRO / ITO YOICHI / YASUSHI MITSUO et al. | Europäisches Patentamt | 2019

    Freier Zugriff

    Reachable set estimation for discrete‐time singular systems

    Li, Jiangrong / Feng, Zhiguang / Zhang, Changzhu | British Library Online Contents | 2017



    Evaluation of the Reachable Domain of Launch Vehicles Under Thrust Fault

    Li, Keshu / Zhang, Wanqing / Miao, Xinyuan et al. | Springer Verlag | 2025


    Reachable set Method and Device for generating reachable set-based parking route

    CHUNG CHUNG CHOO / OH IN HYUK / SEO JU WON et al. | Europäisches Patentamt | 2025

    Freier Zugriff