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    Titel :

    Recent Radiation Test Results on COTS AI Edge Processing ASICs


    Beteiligte:
    Megan Casey (Autor:in) / Ed Wyrwas (Autor:in) / Rebekah Austin (Autor:in)

    Kongress:

    NEPP Electronics Technology Workshop (ETW) ; 2022 ; Greenbelt, MD, US


    Erscheinungsdatum :

    30.09.2022


    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch




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