Single-event destructive behavior and latchup has been observed in two separate radiation-hardened switching regulators. We discuss the test conditions and observed results.
Destructive Single-Events and Latchup in Radiation-Hardened Switching Regulators
2017-10-01
Preprint
Keine Angabe
Englisch
Latent damage from single-event latchup
NTRS | 2002
|Single Event Latchup Protection of Integrated Circuits
British Library Online Contents | 1997
|Single Event Latchup Protection of Integrated Circuits
British Library Conference Proceedings | 1997
|Latchup in CMOS Integrated Circuits
NTRS | 1985
|Relationship Between Latchup And Transistor Current Gain
NTRS | 1989
|