Single-event destructive behavior and latchup has been observed in two separate radiation-hardened switching regulators. We discuss the test conditions and observed results.


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    Titel :

    Destructive Single-Events and Latchup in Radiation-Hardened Switching Regulators


    Beteiligte:
    Pearce, Larry (Autor:in) / van Vonno, Nick W. (Autor:in) / Hart, Shirley (Autor:in) / Scheick, Leif Z. (Autor:in) / Irom, Farokh (Autor:in) / Allen, Gregory R. (Autor:in) / Vartanian, Sergeh (Autor:in)

    Erscheinungsdatum :

    2017-10-01


    Medientyp :

    Preprint


    Format :

    Keine Angabe


    Sprache :

    Englisch



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