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    Titel :

    Reliability Assessment of Wide Bandgap Power Devices


    Beteiligte:
    Boomer, Kristen (Autor:in) / Scheick, Leif (Autor:in) / Lauenstein, Jean-Marie (Autor:in) / Casey, Megan (Autor:in) / Hammoud, Ahmad (Autor:in)

    Kongress:

    NEPP Electronics Technology Workshop ; 2015 ; Greenbelt, MD, United States


    Erscheinungsdatum :

    23.06.2015


    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch





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