Common experimental errors reduced because pulse technique suppresses drifts in thermoelectric measurements. Differential-heat-pulse apparatus measures Seebeck coefficient in semiconductors at temperatures up to 1,900 K. Sample heated to measuring temperature in furnace. Ends of sample then differentially heated a few degrees more by lamps. Differential temperature rise and consequent Seebeck voltage measured via thermocouple leads. Because pulse technique used, errors that often arise from long-term drifts in thermoelectric measurements suppressed. Apparatus works with temperature differences of only few degrees, further increasing accuracy of coefficients obtained.


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    Titel :

    Seebeck Coefficient Measured With Differential Heat Pulses


    Beteiligte:
    Zoltan, L. (Autor:in) / Wood, C. (Autor:in) / Stapfer, G. (Autor:in)

    Erschienen in:

    Erscheinungsdatum :

    1986-06-01



    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch


    Schlagwörter :


    Apparatus Measures Seebeck Coefficient And Resistivity

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    Kreider, K. G. / DeWitt, D. P. / Ripple, D. C. et al. | British Library Conference Proceedings | 1998


    Measuring Seebeck Coefficients With Large Thermal Gradients

    Wood, C. / Chmielewski, A. / Zoltan, L. D. | NTRS | 1986



    DISPOSITIF THERMOELECTRIQUE A EFFET SEEBECK

    CHOPARD FABRICE / GUAZZAGALOPPA JÉRÉMY / HUILLET CÉDRIC | Europäisches Patentamt | 2023

    Freier Zugriff