Document summarizes 15 studies of single-event upsets covering 60 different types of semiconductor devices. Studies discussed in document include verification of basic reactions induced by heavy ions and protons and surveys of latchup and bit-flip susceptibility of several types of devices and device-fabrication technologies.
Single-Event-Upset Studies: A Compilation
NASA Tech Briefs ; 9 , 3
01.01.1986
Sonstige
Keine Angabe
Englisch
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