Document presents data on and analysis of radiation hardness of various semiconductor devices. Data specifies total-dose radiation tolerance of devices. Volume 1 of report covers diodes, bipolar transistors, field effect transistors, silicon controlled rectifiers and optical devices. Volume 2 covers integrated circuits. Volume 3 provides detailed analysis of data in volumes 1 and 2.


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    Titel :

    Radiation-Hardness Data For Semiconductor Devices


    Beteiligte:
    Price, W. E. (Autor:in) / Nichols, D. K. (Autor:in) / Brown, S. F. (Autor:in) / Gauthier, M. K. (Autor:in) / Martin, K. E. (Autor:in)

    Erschienen in:

    Erscheinungsdatum :

    01.11.1984



    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch




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