Document presents data on and analysis of radiation hardness of various semiconductor devices. Data specifies total-dose radiation tolerance of devices. Volume 1 of report covers diodes, bipolar transistors, field effect transistors, silicon controlled rectifiers and optical devices. Volume 2 covers integrated circuits. Volume 3 provides detailed analysis of data in volumes 1 and 2.
Radiation-Hardness Data For Semiconductor Devices
NASA Tech Briefs ; 8 , 2
01.11.1984
Sonstige
Keine Angabe
Englisch
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