The ellipsometers for terahertz spectral range with free electron laser light source was constructed. Different schemes were compared, describing the sensitivity with analyzing measurement error. Setups were numerically simulated and compared with experiments. Terahertz ellipsometry spectra's for water based liquids, and dielectrics (PMMA, teflon, silicon) were obtained. Some optical constants (thickness, absorption, refractive indexes) were calculated from measurements.


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    Titel :

    Study terahertz ellipsometry setups for measuring metals and dielectrics using free electron laser light source


    Beteiligte:
    Rudych, P.D. (Autor:in)


    Erscheinungsdatum :

    01.09.2006


    Format / Umfang :

    1035172 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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