Summary form only given. We show that the profile of buried oxide apertures within selectively oxidized AlGaAs VCSELs is influenced by the composition of surrounding layers, which in turn affects the VCSEL performance.
Design of oxide aperture profile within selectively oxidized VCSELs
01.01.1998
201749 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
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