Summary form only given. Differential carrier lifetimes of index-guided oxide-confined (980 nm) vertical cavity surface-emitting lasers (VCSELs) were obtained from laser impedance measurements at subthreshold currents and equivalent circuit modeling.
Carrier lifetimes in vertical cavity surface emitting lasers determined from electrical impedance measurements
01.01.1998
125412 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
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