Summary form only given. Differential carrier lifetimes of index-guided oxide-confined (980 nm) vertical cavity surface-emitting lasers (VCSELs) were obtained from laser impedance measurements at subthreshold currents and equivalent circuit modeling.


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    Titel :

    Carrier lifetimes in vertical cavity surface emitting lasers determined from electrical impedance measurements


    Beteiligte:
    Giudice, G.E. (Autor:in) / Kuksenkov, D.V. (Autor:in) / Temkin, H. (Autor:in) / Lear, K.L. (Autor:in)


    Erscheinungsdatum :

    01.01.1998


    Format / Umfang :

    125412 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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