Zugriff

    Zugriff prüfen

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    Noniinear Refractive Index Measurement By Z-scan Technique In Amorphous As2s, Thin Film


    Beteiligte:
    Yeung Lak Lee, (Autor:in) / Seong Gyu Kim, (Autor:in) / Chong Hoon Kwak, (Autor:in) / Ok Shik Choe, (Autor:in)


    Erscheinungsdatum :

    01.01.1997


    Format / Umfang :

    294491 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



    EZ-scan: single-beam measurement technique for thin-film nonlinearities [2229-17]

    Xia, T. / Sheik-Bahae, M. / Wang, Z. et al. | British Library Conference Proceedings | 1994


    Measurement of optical nonlinear refractive index response of graphene nanoparticles dispersed in an aqueous solution by Z scan technique

    Jiménez-Pérez, J.L. / Gutiérrez-Fuentes, R. / López-Gamboa, G. et al. | British Library Online Contents | 2018


    Imaging-eclipsing-Z-scan method for measurement of the nonlinear refractive index of materials [3572-39]

    Mohebi, M. / Jamasbi, N. / Morales, O. et al. | British Library Conference Proceedings | 1999


    Measurement of a 3-D Refractive index Distribution by MHOI Technique

    Bedarida, F. / Boccacci, P. / Dall'Aglio, G. et al. | British Library Online Contents | 1996


    Physical mechanism of refractive index inhomogeneity of hafnium oxide thin film prepared by ion beam sputtering technique

    Liu, Huasong / Wang, Lishuan / Li, Shida et al. | British Library Online Contents | 2018