Optical near-field in subwavelength air-dielectric structure is studied by a collection-mode near-field optical microscopy. Concentrated optical near-field and large polarization anisotropy at the dielectric regions are measured. From the simulation of finite-difference time-domain method, we conclude the edge diffraction dominating the optical near-field distribution.


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    Titel :

    Edge diffraction induced near-field contrast in subwavelength structure


    Beteiligte:
    Hsieh-Li Chou, (Autor:in) / Yi-Chun Chen, (Autor:in) / Pei-Kuen Wei, (Autor:in)


    Erscheinungsdatum :

    01.01.2003


    Format / Umfang :

    81184 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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