A novel simultaneous fault detection and diagnostics (FDD) and fault tolerant control (FTC) strategy for nonlinear stochastic systems in closed loops based on a continuous stirred tank reactor (CSTR) is presented. The purpose of control is to track the reactant concentration setpoint. Instead of output feedback we propose here to use proportional-integral-derivative (PID) state feedback, which is shown essential to achieve FTC against sensor faults. A new concept of "equivalent bias" is proposed to model the sensor faults. Both the states and the equivalent bias are on-line estimated by a pseudo separate-bias estimation algorithm. The estimated equivalent bias is then evaluated via a modified Bayes' classification based algorithm to detect and diagnose the sensor faults. Many kinds of sensor faults are tested by Monte Carlo simulations, which demonstrate that the proposed strategy has definite fault tolerant ability against sensor faults, moreover the sensor faults can be on-line detected, isolated, and estimated simultaneously.


    Zugriff

    Zugriff prüfen

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    Fault diagnostics and fault tolerant control


    Beteiligte:
    Zhou, D.H. (Autor:in) / Frank, P.M. (Autor:in)


    Erscheinungsdatum :

    01.04.1998


    Format / Umfang :

    732062 byte




    Medientyp :

    Aufsatz (Zeitschrift)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



    Fault Diagnostics and Fault Tolerant Control

    Zhou, D.H. | Online Contents | 1998


    Fault-Tolerant Control and Diagnostics for Large-Scale Systems

    Eryurek, E. / Upadhyaya, B. R. | British Library Online Contents | 1995


    Fault-Tolerant Control

    Ding, Ruqi / Cheng, Min | Springer Verlag | 2024


    Fault Tolerant Control

    LEE JONW WON | Europäisches Patentamt | 2024

    Freier Zugriff

    Fault-Tolerant Components versus Fault-Tolerant Systems

    Muller, A. / Plankensteiner, M. / VDI/VDE-Gesellschaft Mess und Automatisierungstechnik | British Library Conference Proceedings | 2002