Summary form only given. The solid immersion lens (SIL) is an aberration-free solid lens of high refractive index material with a truncated-sphere shape. Combining the SIL with a standard optical microscope, PL imaging with high-spatial resolution and high collection efficiency was demonstrated. In this work we applied the SIL to microscopic photoluminescence (micro-PL) spectroscopy and imaging to characterize local electronic properties and real-space carrier migration of sub-/spl mu/m-scale in facet-growth GaAs quantum well (QW) structures.


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    Titel :

    Solid-immersion photoluminescence imaging and spectroscopy with high-spatial resolution on GaAs nanostructures


    Beteiligte:
    Yoshita, M. (Autor:in) / Baba, M. (Autor:in) / Akiyama, H. (Autor:in)


    Erscheinungsdatum :

    01.01.1999


    Format / Umfang :

    282016 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch




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