Testing analog circuits is a challenging endeavor. The subject paper investigates the Oscillation-based Built-In Self-Test (OBIST) technique for testing the analog circuits. An analog circuit-testing environment based on the OBIST method is considered and implemented.Experimental results show that OBIST is a promising testing method for analog circuits which neither requires a stimulus generator nor a complex result analyzer.


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    Titel :

    Built-In Hardware for Analog Circuitry Testing


    Beteiligte:
    Assaf, Mansour H. (Autor:in) / Fathi, Maryam (Autor:in)


    Erscheinungsdatum :

    01.09.2008


    Format / Umfang :

    992831 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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