Confocal photoluminescence has been used to spatially resolve AlGaAs composition changes of 4% and quantum well thickness reductions of 70% in a non-planar structure created by vapor phase epitaxial shadow masking.


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    Titel :

    Characterization of non-planar shadow masked Al/sub x/Ga/sub 1-x/As structures by confocal photoluminescence microscopy


    Beteiligte:
    Sandusky, J.V. (Autor:in) / Armour, E.A. (Autor:in) / Ramer, J.C. (Autor:in) / Hersee, S.D. (Autor:in) / Brueck, S.R.J. (Autor:in)

    Erschienen in:

    Proceedings of LEOS'94 ; 2 ; 5-6 vol.2


    Erscheinungsdatum :

    01.01.1994


    Format / Umfang :

    191971 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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