A measurement method includes: generating second measurement data by performing filter processing on first measurement data; calculating a first deflection amount based on an approximate equation of deflection of a structure; calculating a second deflection amount by performing filter processing on the first deflection amount; calculating a third deflection amount based on the second deflection amount and a first-order coefficient and a zero-order coefficient which are calculated based on the second measurement data and the second deflection amount; calculating an offset based on the zero-order coefficient, the second deflection amount, and the third deflection amount; calculating a static response by adding the offset and a product of the first-order coefficient and the first deflection amount; calculating a first dynamic response by subtracting the static response from the first measurement data; calculating a second dynamic response by attenuating an unnecessary signal from the first dynamic response; and calculating an attenuation rate of the second dynamic response based on an envelope amplitude of the second dynamic response.


    Zugriff

    Download


    Exportieren, teilen und zitieren



    Titel :

    Measurement Method, Measurement Device, Measurement System, And Measurement Program


    Beteiligte:

    Erscheinungsdatum :

    05.01.2023


    Medientyp :

    Patent


    Format :

    Elektronische Ressource


    Sprache :

    Englisch


    Klassifikation :

    IPC:    B61L Leiten des Eisenbahnverkehrs , GUIDING RAILWAY TRAFFIC / E01D BRIDGES , Brücken / G01H MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES , Messen von mechanischen Schwingungen oder Ultraschall-, Schall- oder Infraschallwellen



    Measurement method, measurement device, measurement system, and measurement program

    KOBAYASHI YOSHIHIRO | Europäisches Patentamt | 2022

    Freier Zugriff

    Measurement method, measurement device, measurement system, and measurement program

    KOBAYASHI YOSHIHIRO | Europäisches Patentamt | 2024

    Freier Zugriff

    Measurement method, measurement device, measurement system, and measurement program

    KOBAYASHI YOSHIHIRO | Europäisches Patentamt | 2025

    Freier Zugriff

    Measurement Method, Measurement Device, Measurement System, And Measurement Program

    KOBAYASHI YOSHIHIRO | Europäisches Patentamt | 2023

    Freier Zugriff

    Measurement Method, Measurement Device, Measurement System, And Measurement Program

    KOBAYASHI YOSHIHIRO | Europäisches Patentamt | 2023

    Freier Zugriff