A measurement method includes: a step of acquiring first observation point information; a step of acquiring second observation point information; a step of calculating a path deflection waveform at a third observation point; a step of calculating a path deflection waveform at a central position between the first observation point and the second observation point; a step of calculating a measurement waveform as a physical quantity at the third observation point; a step of calculating an amplitude coefficient at which a difference is minimized between the measurement waveform and a waveform obtained by multiplying the path deflection waveform at the third observation point by the amplitude coefficient; and a step of calculating, based on the path deflection waveform at the central position and the amplitude coefficient, an estimation waveform as a physical quantity at the central position.
Measurement Method, Measurement Device, Measurement System, And Measurement Program
2021-09-30
Patent
Elektronische Ressource
Englisch
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