In some embodiments, a LIDAR system may include at least one processor configured to control at least one light source for projecting light toward a field of view and receive from at least one first sensor first signals associated with light projected by the at least one light source and reflected from an object in the field of view, wherein the light impinging on the at least one first sensor is in a form of a light spot having an outer boundary. The processor may further be configured to receive from at least one second sensor second signals associated with light noise, wherein the at least one second sensor is located outside the outer boundary; determine, based on the second signals received from the at least one second sensor, an indicator of a magnitude of the light noise; and determine, based on the indicator the first signals received from the at least one first sensor and, a distance to the object.


    Zugriff

    Download


    Exportieren, teilen und zitieren



    Titel :

    PATTERN RECOGNITION USED TO CHARACTERIZE LIDAR WINDOW OBSTRUCTION


    Beteiligte:
    OSIROFF NIR (Autor:in) / SHANI MATITYAHU (Autor:in) / ELOOZ DAVID (Autor:in) / DAVID RALY SMADAR (Autor:in)

    Erscheinungsdatum :

    17.09.2020


    Medientyp :

    Patent


    Format :

    Elektronische Ressource


    Sprache :

    Englisch


    Klassifikation :

    IPC:    G01S RADIO DIRECTION-FINDING , Funkpeilung / B60S SERVICING, CLEANING, REPAIRING, SUPPORTING, LIFTING, OR MANOEUVRING OF VEHICLES, NOT OTHERWISE PROVIDED FOR , Warten, Reinigen, Instandsetzen, Unterstützen, Anheben oder Rangieren von Fahrzeugen, soweit nicht anderweitig vorgesehen



    Pattern recognition used to characterize LIDAR window obstruction

    OSIROFF NIR / SHANI MATITYAHU / ELOOZ DAVID et al. | Europäisches Patentamt | 2024

    Freier Zugriff

    Lidar obstruction detection

    TEREFE NEHEMIA GIRMA / PIRACHA MOHAMMAD UMAR / TING SAMANTHA MARIE | Europäisches Patentamt | 2025

    Freier Zugriff

    Illuminator obstruction detection to identify an obstruction on an optical window

    HERMAN DAVID MICHAEL / ARUNMOZHI ASHWIN / KRISHNAN VENKATESH | Europäisches Patentamt | 2021

    Freier Zugriff

    Updating a Pattern Recognition Algorithm to Characterize High-Porosity Lunar Simulants

    Joshi, D. R. / Eustes, A. W. / Rostami, J. et al. | TIBKAT | 2021


    Characterize Rail Crack Pattern Through Image Analysis

    DeVine, Ryan / Qian, Yu / Wang, Yi et al. | British Library Conference Proceedings | 2020