Systems and methods described herein are directed towards a test data generator. In some examples, a reference polygon may be received from an application. Additionally a control parameter may be received from the application. Two points on a map may be selected and a path between the two points may be generated. Additional points may be created along the path and test may be generated by processing the additional points. The test data may be provided to the application.


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    Titel :

    PATTERN-BASED AUTOMATED TEST DATA GENERATION


    Beteiligte:
    PARK HOYONG (Autor:in) / BYCHKOV VITALY (Autor:in)

    Erscheinungsdatum :

    2018-09-27


    Medientyp :

    Patent


    Format :

    Elektronische Ressource


    Sprache :

    Englisch


    Klassifikation :

    IPC:    G01C Messen von Entfernungen, Höhen, Neigungen oder Richtungen , MEASURING DISTANCES, LEVELS OR BEARINGS / G06F ELECTRIC DIGITAL DATA PROCESSING , Elektrische digitale Datenverarbeitung / G08G Anlagen zur Steuerung, Regelung oder Überwachung des Verkehrs , TRAFFIC CONTROL SYSTEMS



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