Automated Test Data Generation from Descartes Specifications
World conference; 2nd, Integrated design and process technology ; 1996 ; Austin; TX
01.01.1996
8 pages
Also known as IDPT
Aufsatz (Konferenz)
Englisch
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Automated testing from specifications
IEEE | 2002
|Engineering Index Backfile | 1946
|