Whether an internal defect is present in an inspection target is readily judged. Provided is an inspection method for an inspection target that is a layered structure including an FRP material and/or a structure made of resin, the method including the steps of: tapping, with a tapping tool, an inspection target area on a surface of the inspection target; detecting, by an accelerometer mounted to the tapping tool, an acceleration signal corresponding to acceleration of the tapping tool due to reaction force against the tapping; recording waveform data about the detected acceleration signal; creating a contour map corresponding to the inspection target area, based on the recorded waveform data; displaying the contour map on a display unit; and judging whether an internal defect is present in the inspection target, based on the contour map displayed on the display unit.


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    Titel :

    Inspection apparatus and inspection method for inspection target


    Beteiligte:
    MIYAKE HISAO (Autor:in) / FUJIOKA YOSHIHIRO (Autor:in) / MORII YOSHIYUKI (Autor:in)

    Erscheinungsdatum :

    14.02.2023


    Medientyp :

    Patent


    Format :

    Elektronische Ressource


    Sprache :

    Englisch


    Klassifikation :

    IPC:    G01N Untersuchen oder Analysieren von Stoffen durch Bestimmen ihrer chemischen oder physikalischen Eigenschaften , INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES / B64C AEROPLANES , Flugzeuge / G01M TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES , Prüfen der statischen oder dynamischen Massenverteilung rotierender Teile von Maschinen oder Konstruktionen



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