A method of determining payload potential may include the steps of receiving data on a first bias voltage and a resulting first collected current of a first needle of a multi-needle Langmuir probe, receiving data on a second bias voltage and a resulting second collected current of a second needle of the multi-needle Langmuir probe, assigning a value for the electron temperature in which the multi-needle Langmuir probe was operating, and using the current and voltage data, the assigned electron temperature value and Langmuir probe theory to calculate the platform potential of the multi-needle Langmuir probe.


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    Titel :

    Langmuir probe


    Beteiligte:
    PEDERSEN ARNE (Autor:in) / BEKKENG TORE ANDRÉ (Autor:in) / TRONDSEN ESPEN (Autor:in) / MOEN JØRAN (Autor:in)

    Erscheinungsdatum :

    11.06.2019


    Medientyp :

    Patent


    Format :

    Elektronische Ressource


    Sprache :

    Englisch


    Klassifikation :

    IPC:    G01R Messen elektrischer Größen , MEASURING ELECTRIC VARIABLES / H05H Plasmatechnik , PLASMA TECHNIQUE / B64G Raumfahrt , COSMONAUTICS



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