A method of determining payload potential may include the steps of receiving data on a first bias voltage and a resulting first collected current of a first needle of a multi-needle Langmuir probe, receiving data on a second bias voltage and a resulting second collected current of a second needle of the multi-needle Langmuir probe, assigning a value for the electron temperature in which the multi-needle Langmuir probe was operating, and using the current and voltage data, the assigned electron temperature value and Langmuir probe theory to calculate the platform potential of the multi-needle Langmuir probe.


    Zugriff

    Download


    Exportieren, teilen und zitieren



    Titel :

    LANGMUIR PROBE


    Weitere Titelangaben:

    LANGMUIR-SONDE
    SONDE DE LANGMUIR


    Beteiligte:
    PEDERSEN ARNE (Autor:in) / BEKKENG TORE ANDRÉ (Autor:in) / TRONDSEN ESPEN (Autor:in) / MOEN JØRAN (Autor:in)

    Erscheinungsdatum :

    16.08.2017


    Medientyp :

    Patent


    Format :

    Elektronische Ressource


    Sprache :

    Englisch


    Klassifikation :

    IPC:    H05H Plasmatechnik , PLASMA TECHNIQUE / B64G Raumfahrt , COSMONAUTICS



    Langmuir probe

    PEDERSEN ARNE / BEKKENG TORE ANDRÉ / TRONDSEN ESPEN et al. | Europäisches Patentamt | 2019

    Freier Zugriff

    UV-Cleaned Langmuir Probe

    Steigies, C.T. / Barjatya, A. / European Space Agency | British Library Conference Proceedings | 2013


    UV-Cleaned Langmuir Probe

    Steigies, C. T. / Barjatya, A. | TIBKAT | 2013

    Freier Zugriff

    Simulations of a Langmuir Probe

    Aktas, Densu | AIAA | 2012


    Simulations of a Langmuir Probe

    Aktas, D. / American Institute of Aeronautics and Astronautics | British Library Conference Proceedings | 2012