To provide a survey system which can obtain a product of a three-dimensional survey with higher accuracy.SOLUTION: A survey system (1,1',1") comprises: a movable body (2); a scanner (3) having: an emission section (3a) which emits distance measurement light (3h'); a light receiving section (3b) which receives the reflected distance measurement light (3l'); a distance measurement section (3c) which performs distance measurement on the basis of an output of the light receiving section; a first optical axis deflection section (3f,3 g) which is disposed on an optical axis (3h) of the distance measurement light and deflects the distance measurement light; a second optical axis deflection section (3j,3k) which is disposed on a light receiving optical axis (3l) of the reflected distance measurement light and deflects the reflected distance measurement light at the same deflection angle and in the same direction as in the first optical axis deflection section; and an emission direction detection section (3 m) which detects the deflection angle and direction of the first optical axis deflection section and the second optical axis deflection section; a posture detector (5,13) which detects a posture of the scanner; and a position measurement device (4,20) which measures a position of the scanner.SELECTED DRAWING: Figure 8

    【課題】三次元測量の成果物をより高精度に得ることのできる測量システムを提供する。【解決手段】測量システム(1,1’,1”)は、移動体(2)と、測距光(3h’)を発する出射部(3a),反射測距光(3l’)を受光する受光部(3b),前記受光部の出力に基づき測距を行う測距部(3c),前記測距光の光軸(3h)上に配置され前記測距光を偏向する第一光軸偏向部(3f,3g)、前記反射測距光の受光光軸(3l)上に配置され前記第一光軸偏向部と同一の偏角および方向で前記反射測距光を偏向する第二光軸偏向部(3j,3k),および前記第一光軸偏向部および前記第二光軸偏向部の偏角および方向を検出する出射方向検出部(3m)を有するスキャナ(3)と、前記スキャナの姿勢を検出する姿勢検出装置(5,13)と、前記スキャナの位置を測定する位置測定装置(4,20)と、を備える。【選択図】図8


    Zugriff

    Download


    Exportieren, teilen und zitieren



    Titel :

    SURVEY SYSTEM


    Weitere Titelangaben:

    測量システム


    Beteiligte:

    Erscheinungsdatum :

    2019-04-11


    Medientyp :

    Patent


    Format :

    Elektronische Ressource


    Sprache :

    Japanisch


    Klassifikation :

    IPC:    G01C Messen von Entfernungen, Höhen, Neigungen oder Richtungen , MEASURING DISTANCES, LEVELS OR BEARINGS / B64C AEROPLANES , Flugzeuge / B64D Ausrüstung für Flugzeuge , EQUIPMENT FOR FITTING IN OR TO AIRCRAFT



    SURVEY SYSTEM, SURVEY METHOD, AND SURVEY PROGRAM

    MURAKUMO YUTAKA / WAKE CHIHIRO / KATO HIROKI | Europäisches Patentamt | 2023

    Freier Zugriff

    SURVEY SYSTEM, SURVEY METHOD AND PROGRAM FOR SURVEY

    ITO TADAYUKI / SASAKI TAKESHI | Europäisches Patentamt | 2022

    Freier Zugriff

    SURVEY SYSTEM

    NISHIDA NOBUYUKI / OSARAGI KAZUKI / HAIJIMA YASUHITO et al. | Europäisches Patentamt | 2018

    Freier Zugriff

    SURVEY SYSTEM

    KONO TAIZO | Europäisches Patentamt | 2022

    Freier Zugriff

    Survey system

    NISHITA NOBUYUKI / SASAKI YOU | Europäisches Patentamt | 2022

    Freier Zugriff