Highlights Single Event Upsets were observed during the “Flying Laptop” satellite mission. Detection of the SEU locations above the Earth on a 610 km Sun-Synchronous LEO. Detection of upset rate in SRAM device of the On-Board Computer. Root causes are traced to trapped protons within the SAA, SEPs and GCRs. The observed flight data agree with the standard energetic particle models.

    Abstract The radiation effects in electronic parts arecalled single-event effects, which are deemed to be critical for space missions. This paper presents the Single Event Upsets that were observed in an onboard memory device of the Low Earth Orbit “Flying Laptop” satellite mission during its in-orbit operation. The Single Event Upsets were carefully mapped on the satellite orbital space itself and their root causes were investigated together with their rates of occurrence. Subsequently, the events were traced to show several root cause sources such as (i) trapped energetic protons leaking to low altitudes within the South Atlantic Anomaly, (ii) Solar Energetic Particles emitted by an impulsive event on 10 September 2017, and (iii) Galactic Cosmic Rays. A profound analysis was carried out on the observed flight data, and its corresponding results are actually in agreement with the standard energetic particle models. The presented results provide another important insight on the Single Event Upsets for future Low Earth Orbit satellite missions.


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    Titel :

    Single event upset investigations on the “Flying Laptop” satellite mission


    Beteiligte:

    Erschienen in:

    Advances in Space Research ; 67 , 6 ; 2000-2009


    Erscheinungsdatum :

    2020-12-25


    Format / Umfang :

    10 pages




    Medientyp :

    Aufsatz (Zeitschrift)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch




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