We studied measurement of secondary electron emission (SEE) of metal and insulating materials used for satellite thermal insulation or other such purposes. The SEE yield measurement is very important for analyzing charge accumulation on satellite surfaces for a space environment because electron emission related to irradiated electrons influences the amount of surface charge. Therefore, we tried to measure the SEE yield. Furthermore, we must consider degradation phenomena of surface materials for spacecraft caused by radioactive rays. According to the degradation of materials, those SEE yields might change compared to a non‐degradation sample. Therefore, we tried to measure the SEE yields of surface materials for spacecraft which are treated using the degradation process. For preparing a degradation sample, those samples were irradiated by an electron beam and UV to simulate degradation in a space environment. We take three irradiation conditions for electron beam and UV irradiation that related with GEO orbit and operating period.

    This report introduces measurement results of reference materials (Au, Ag, and quartz glass) and surface materials for the satellite. Furthermore, we introduce a few results of the SEE yield of the satellite materials applied degradation process simulated space environment and discuss the relationship between the SEE yields and sample degradation when irradiated by an e‐beam and UV.


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    Titel :

    Secondary Electron Emission as a Measure of Sample Degradation Irradiated with Electrons and UV


    Beteiligte:
    Miyake, Hiroaki (Autor:in) / Nitta, Kumi (Autor:in) / Michizono, Shinichiro (Autor:in) / Saito, Yoshio (Autor:in) / Kleiman, Jacob I. (Herausgeber:in)

    Kongress:

    PROTECTION OF MATERIALS AND STRUCTURES FROM SPACE ENVIRONMENT: Proceedings of the 9th International Conference: Protection of Materials and Structures From Space Environment ; 2008 ; Toronto (Canada)


    Erschienen in:

    AIP Conference Proceedings ; 1087 , 1 ; 645-649


    Erscheinungsdatum :

    05.01.2009


    Format / Umfang :

    5 pages





    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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