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    Titel :

    Secondary Electron Emission as a Measure of Sample Degradation Irradiated with Electrons and UV



    Kongress:

    Conference; 9th, Protection of materials and structures from space environment ; 2008 ; Toronto, Canada



    Erscheinungsdatum :

    01.01.2009


    Format / Umfang :

    5 pages


    Anmerkungen:

    Includes bibliographical references and indexes. Proceedings of the 9th International Conference (ICPMSE-9). ICPMSE-9.




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




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