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    Titel :

    Research on Accelerated Aging Test and Junction Temperature Detection Method of IGBT


    Beteiligte:
    Sha, Yanbei (Autor:in) / Pan, Guangze (Autor:in) / Guo, Mengxue (Autor:in) / Wei, Lu (Autor:in) / Peng, Yang (Autor:in)

    Kongress:

    International Conference on Electrical Engineering and Information Technologies for Rail Transportation ; 5. ; 2021 ; Tsingtau



    Erscheinungsdatum :

    2022



    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch



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