Investigation and tuning of organic thin films by methods of atomic force microscopy
2019
VIII, 221 Seiten
Illustrationen, Diagramme
Literaturverzeichnis: Seite 201-212
Hochschulschrift
Englisch
Atomic Force Microscopy: AFM helps engineer low-scatter thin films
British Library Online Contents | 1998
|Optical Microscopy, Atomic Force Microscopy (AFM) and SNOM
British Library Online Contents | 1998
|Investigation of Ferroelectric Domains in LiNbO~3 with Atomic Force Microscopy
British Library Conference Proceedings | 2003
|Investigation of Photorefractive Strontium-Barium-Niobate Crystals with Atomic Force Microscopy
British Library Conference Proceedings | 2003
|Atomic force microscopy in zero-g
IEEE | 2003
|