Effect of Cavity Length, Strain, and Mesa Capacitance on 1.5-μm VCSELs Performance
JOURNAL OF LIGHTWAVE TECHNOLOGY ; 35 , 15 ; 3130-3141
2017-01-01
12 pages
Aufsatz (Zeitschrift)
Englisch
DDC: | 621.3692 |
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Reliability of direct mesa flip-chip bonded VCSELs
IEEE | 2004
|Coupled Cavity Phenomena within MEMS-Tunable Long-Wavelength VCSELs
British Library Conference Proceedings | 2005
|Cavity structures for low-loss oxide-confined VCSELs [3003-27]
British Library Conference Proceedings | 1997
|