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    Titel :

    Characterization of Defects in Waveguides Formed by Electron Irradiation of Silica-on-Silicon


    Beteiligte:
    Spaargaren, S. M. (Autor:in) / Syms, R. R. (Autor:in)

    Erschienen in:

    Erscheinungsdatum :

    2000-01-01


    Format / Umfang :

    7 pages



    Medientyp :

    Aufsatz (Zeitschrift)


    Format :

    Print


    Sprache :

    Englisch


    Klassifikation :

    DDC:    621.3692



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    Syms, R. R. A. / Tate, T. J. / Lewandowski, J. J. | British Library Online Contents | 1994


    Optical waveguides fabricated by electron-beam irradiation of Ge-doped flame-hydrolysis silica

    Garcia-Blanco, S. / Aitchison, J.S. / Marques, P.V.S. et al. | IEEE | 2004


    Low-loss Near-infrared Passive Optical Waveguide Components Formed by Electron Beam Irradiation of Silica-on-Silicon

    Syms, R. R. A. / Tate, T. J. / Bellerby, R. | British Library Online Contents | 1995


    Sensors formed with optical waveguides and micromechanical structures on silicon

    Boyd, Joseph / De Brabander, N. / Burcham, E. et al. | AIAA | 1994


    Controlled formation of buried-channel waveguides by electron beam irradiation of glassy layers of silicon

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