Zugriff

    Zugriff über TIB

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    Raman emission in porous silicon at 1.54 mum [5451-94]



    Kongress:

    Conference, Integrated optics and photonic integrated circuits ; 2004 ; Strasbourg, France



    Erscheinungsdatum :

    2004-01-01


    Format / Umfang :

    9 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Wavelength conversion using parametric Raman scattering in silicon microstructures (Invited Paper) [5451-44]

    Jalali, B. / Raghunathan, V. / Claps, R. et al. | British Library Conference Proceedings | 2004


    Micro-Raman investigation of optical quality lithium niobate wafers [5451-12]

    Caccavale, F. / Morbiato, A. / Properzi, M. et al. | British Library Conference Proceedings | 2004


    Optical characterization of 1-GHz silicon-based optical modulator [5451-91]

    Jones, R. / Liao, L. / Liu, A. et al. | British Library Conference Proceedings | 2004


    Erbium-doped porous silicon emits at 1.54 m

    British Library Online Contents | 1996


    Polarization-independent optical ring resonators on silicon on insulator [5451-42]

    Headley, W. R. / Reed, G. T. / Liu, A. et al. | British Library Conference Proceedings | 2004