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    Titel :

    Micro-Raman investigation of optical quality lithium niobate wafers [5451-12]



    Kongress:

    Conference, Integrated optics and photonic integrated circuits ; 2004 ; Strasbourg, France



    Erscheinungsdatum :

    2004-01-01


    Format / Umfang :

    7 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Raman emission in porous silicon at 1.54 mum [5451-94]

    Sirleto, L. / Raghunathan, V. / Rossi, A. M. et al. | British Library Conference Proceedings | 2004


    High-quality waveguides by reverse proton exchange in stoichiometric lithium tantalate [5451-13]

    Marangoni, M. / Osellame, R. / Ramponi, R. et al. | British Library Conference Proceedings | 2004


    High photorefractive resistance of hafnium-doped, single-domain, and periodically poled lithium niobate crystals (Invited Paper) [5451-10]

    Degiorgio, V. / Kokanyan, E. P. / Razzari, L. et al. | British Library Conference Proceedings | 2004


    Optical characterization of 1-GHz silicon-based optical modulator [5451-91]

    Jones, R. / Liao, L. / Liu, A. et al. | British Library Conference Proceedings | 2004


    An integrated Si-based electro-optical modulator [5451-35]

    Sciuto, A. / Libertino, S. / Coffa, S. et al. | British Library Conference Proceedings | 2004