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    Titel :

    Thickness and composition monitoring of thin layers of InGaAs in InP/InGaAsP epitaxial growths using FESEM and integrated SIMS profiles



    Kongress:

    6th, International conference on applications of photonic technology; closing the gap between theory, development, and application ; 2003 ; Quebec City, Canada



    Erscheinungsdatum :

    2003-01-01


    Format / Umfang :

    7 pages


    Anmerkungen:

    Also known as ICAPT 2003




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Optimization of InGaAs/InGaAsP MQW Semiconductor Amplifiers

    Jepsen, K. S. / Mikkelsen, B. / Yamaguchi, M. et al. | British Library Conference Proceedings | 1992


    Optimization of InGaAs/InGaAsP MQW mqw semiconductor amplifiers

    Jepsen, K.S. / Mikkelsen, B. / Stubkjaer, K.E. | IEEE | 1992


    Polarization Dependent -Factor in InGaAs/InGaAsP MQW Material

    Soerensen, M. / Storkfelt, N. / Jepsen, K. S. et al. | British Library Conference Proceedings | 1992


    Characteristic analysis of InGaAs/InGaAsP strained quantum well lasers

    Ma, C. / Han, C. / Liu, S. | British Library Online Contents | 1997


    Polarization dependent a-factor in InGaAs/InGaAsP MQW material

    Soerensen, M. / Storkfelt, N. / Jepsen, K.S. et al. | IEEE | 1992