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    Titel :

    Laser-based measurement to nanometer scale accuracy [4420-22]



    Kongress:

    Technical conference, Laser metrology for precision measurement and inspection in industry ; 1999 ; Florianopolis, Brazil



    Erscheinungsdatum :

    01.01.2001


    Format / Umfang :

    11 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Interferometric length and roughness measurements with nanometer accuracy level [4420-03]

    Titov, A. / Malinovsky, I. / Belaidi, H. et al. | British Library Conference Proceedings | 2001


    Nr. 4420

    DataCite | 1930


    Traceable measurement results from scanning probe microscopes by laser interferometry [4420-21]

    Hasche, K. / Herrmann, K. / Seemann, R. et al. | British Library Conference Proceedings | 2001


    User's guide to IR detectors [4420-09]

    Boreman, G. D. / Society for Optical Engineering / IMEKO - The International Measurement Confederation et al. | British Library Conference Proceedings | 2001


    New generation of lasermike [4420-10]

    Jablonski, R. / Fotowicz, P. / Society for Optical Engineering et al. | British Library Conference Proceedings | 2001